Working in partnership with academia and public/private institutions, Direct Electron continues to deliver a stream of innovations for TEM.
Our commitment to innovation delivers salient advantages to our customers:
[1] Xuong NH, Milazzo AC, LeBlanc P, Duttweiler F, Bouwer J, Peltier S, Ellisman M, Denes P, Bieser F, Matis HS, Wieman H, Kleinfelder S. “First use of a high-sensitivity active pixel sensor array as a detector for electron microscopy.” Proceedings of the SPIE 5301, 242–249 (2004). View Publication.
[2] Jin L, Milazzo AC, Kleinfelder S, Li S, Leblanc P, Duttweiler F, Bouwer JC, Peltier ST, Ellisman MH, Xuong NH. “Applications of direct detection device in transmission electron microscopy.” Journal of Structural Biology 161, 352-358 (2008). View Publication.
[3] Ibid.
[4] Jin L. “Direct detection in transmission electron microscopy.” Dissertation, University of California San Diego (2009). View Publication.
[5] Milazzo AC, Cheng A, Moeller A, Lyumkis D, Jacovetty E, Polukas J, Ellisman MH, Xuong NH, Carragher B, Potter CS. “Initial evaluation of a direct detection device detector for single particle cryo-electron microscopy.” Journal of Structural Biology 176, 404-408 (2011). View Publication.
[6] Bammes BE, Rochat RH, Jakana J, Chen DH, Chiu W. “Direct electron detection yields cryo-EM reconstructions at resolutions beyond 3/4 Nyquist frequency.” Journal of Structural Biology 177, 589-601 (2012). View Publication.
[7] Ibid.
[8] Brilot AF, Chen JZ, Cheng A, Pan J, Harrison SC, Potter CS, Carragher B, Henderson R, Grigorieff N. “Beam-induced motion of vitrified specimen on holey carbon film.” Journal of Structural Biology 177, 630-637 (2012). View Publication.
[9] Campbell MG, Cheng A, Brilot AF, Moeller A, Lyumkis D, Veesler D, Pan J, Harrison SC, Potter CS, Carragher B, Grigorieff N. “Movies of ice-embedded particles enhance resolution in electron cryo-microscopy.” Structure 20, 1823-1828 (2012). View Publication.
[10] Bammes BE, Chen DH, Jin L, Bilhorn RB. “Visualizing and correcting dynamic specimen processes in TEM using a Direct Detection Device.” Microscopy & Microanalysis 19, 1320-1321 (2013). View Publication.
[11] Zeng Z, Liang WI, Liao HG, Xin HL, Chu YH, Zheng H. “Visualization of electrode-electrolyte interfaces in LiPF6/EC/DEC electrolyte for lithium ion batteries via in situ TEM.” Nano Letters 14, 1745-1750 (2014). View Publication.
[12] Ramachandra R, Bouwer JC, Mackey MR, Bushong E, Peltier ST, Xuong NH, Ellisman MH. “Improving signal to noise in labeled biological specimens using energy-filtered TEM of sections with a drift correction strategy and a direct detection device.” Microscopy & Microanalysis 20, 706-714 (2014). View Publication.
[13] The DE-64 Camera System was announced at the 2014 Gordon Research Conference in Three-Dimensional Electron Microscopy. View More Information.
[14] The LV-126 was the first commercially available MAPS detector for low-kV EM. View publication.
[15] The University of Göttingen used our photoblind sensor to perform laser-driven ultra-fast TEM experiments without background photon noise. View publication.
[16] The Apollo direct detector was announced in 2021 after eight years of development. View more information.
[17] The Celeritas direct detector for 4D STEM and fast in situ TEM was announced in 2021. View press releaase.