Applications Scientist Barnaby Levin giving Short Talk at DE Sponsored 2024 AIMS conference this Friday, March 22!

LV-SERIES

DIRECT DETECTION CAMERAS For Low-kV Applications

Direct Detectors for Electron Microscopy At 40 kV and Below

 

With the goal of propelling electron microscopy to new frontiers, Direct Electron introduced the first large-format Direct Detection Device (DDD®) in 2008, as the culmination of academic and industrial partnerships working through many generations of sensor development beginning in 2001. As the pioneer in direct electron detection, our revolutionary DDD sensors were recognized with the 2010 Microscopy Today Innovation Award.

Based on our flagship DE-Series cameras for electron microscopy, our LV-16 detector extends direct detection technology for low voltage electron microscopy. This detector offers a powerful new option for low voltage EM techniques such as LEEM/PEEM, EBSD, and more.

To learn more about low-kV applications, visit our Low-kV EM page.

To learn more about our products for low-kV electron microscopy, click on the links below.

Direct Electron LV126 Camera

LV-16

DIRECT DETECTION FOR LEEM/PEEM

With high sensitivity and excellent resolution, the LV-16 offers exceptional performance for 10-40 kV applications.

Direct Electron DE FreeScan

DE-FREESCAN

ADVANCED SCAN GENERATOR

As an accessory to the LV-16, the DE-FreeScan adds capability to scanning mode experiments.

WITH GUIDANCE FROM OUR TEAM OF PH.D MICROSCOPISTS

Mission Control

A Powerful NEW Software SUITE for Electron Microscopy

  • Groundbreaking New Software:
    Fast and responsive user-friendly interface; seamlessly integrated with our cameras.

  • Functionality and Productivity:
    Intuitive tab-based layout for quick navigation; advanced algorithms for high-speed data capture & real-time visualization.

  • Interoperability and Openness:
    Third-party interoperability through flexible SDK & API. Export images in open formats for unrestricted use and analysis.
Questions?