By eliminating the scintillator, our direct detection cameras provide unprecedented resolution and sensitivity. But is that level of resolution truly necessary for materials science? Absolutely! Many materials science applications rely on the ability of investigators to unambiguously detect high-resolution features in an image. Using a poor camera and blurry images makes the delineation of features ambiguous, and (even worse) many high resolution features may not be detectable at all.
Electron holography offers the unique capability to characterize the three-dimensional structure of TEM specimens, since observed phase changes (which are now disentangled from amplitude information in a hologram) is directly proportional to the local thickness of the material through which the electron beam is passing.
Until recently, acquiring electron holograms always has been a technological challenge. On film, both the non-linearity and the modulation transfer function (MTF) impacted the quality of the hologram, as higher order sidebands are generated and higher frequencies are dampened. Although digital cameras are very linear up to at least 70% to their saturation, the MTF of almost every camera on the market drops to around 10% or below at the Nyquist limit and for sampling rates (pixels per interference fringe) s < 10, most MTFs are already below 50% at the location of the sideband.
As a compromise, electron holograms are recorded highly oversampled and the images obtained from the holograms are often downsized as they contain a lot of empty information due to the oversampling. Our DE-Series Cameras are a revolutionary advancement for electron holography, approaching the theoretical limits of an ideal detector for this technique. The linearity, MTF, and array size of our cameras produce high-quality holograms without significant oversampling, to deliver a dramatically larger field-of-view. Additionally, the high sensitivity and per-electron signal-to-noise ratio of our direct detection cameras enable low-dose electron holography for the first time. This critical advancement allows researchers to probe the structure of specimens in an unperturbed state, without the deleterious effects of radiation damage.
Our DE-Series Cameras are unique among direct detection cameras due to their high dynamic range and excellent performance at nearly any dose rate. As a demonstration of our versatility for a wide variety of TEM experiments, our DE cameras overcome the conventional wisdom that electron diffraction is not possible on a direct detector. Not only does the high signal-to-noise ratio of our cameras accurately record the electron diffraction pattern, but our “movie-mode” acquisition also yields additional benefits.
One of the next frontiers in materials science is low-dose imaging. In the ideal case, nearly all specimens in the TEM would be examined under low-dose conditions in order to minimize specimen degradation from high exposure. However, low-dose imaging for materials science has been technically challenging due to the low sensitivity of scintillator-coupled TEM cameras. Our DE-Series Cameras allow users to overcome these challenges and collect brilliant, high-resolution images even under very low dose conditions.
In standard TEM imaging, the intensity of the recorded image is an inseparable combination of the amplitude and phase of the image wave. In contrast, electron holography uses the interference of two waves within the microscope: the incident, undeviated electron wave and the image wave. The resulting interference pattern can be processed using optical techniques to form optical holograms, so that the amplitude and phase components can be separately extracted.